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Tapping Mode AFM Probe with Special Alignment System

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价格:请致电：010-67529703
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The XY-auto-alignment probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125 ?m short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8?m is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225?m.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS? PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
chemically inert
high mechanical Q-factor for high sensitivity
tip repositioning accuracy of better than ± 8 ?m (in combination with Alignment Chip)
AFM Tip:
Shape: Standard
Height: 10 - 15 ?m
Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam
Force Constant: 42 N/m (10 - 130 N/m)*
Resonance Frequency: 330 kHz (204 - 497 kHz)*
Length: 125 ?m (115 - 135 ?m)*
Width: 30 ?m (22.5 - 37.5 ?m)*
Thickness: 4 ?m (3 - 5 ?m)*

* guaranteed rangeThis product features alignment grooves on the back side of the holder chip.

热门产品

Tapping Mode AFM Probe with Special Alignment System

AFM Tip:

AFM Cantilever: