供应nanoworldBrand,NCHRItem#,Standard Tapping Mode AFM Probe

Standard Tapping Mode AFM Probe

型号:NCHR
价格:请致电：010-67529703
品牌:nanoworld

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping? mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Full Technical Data

AFM Tip:

Shape: Standard

Height: 10 - 15 ?m

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (21 - 78 N/m)*

Resonance Frequency: 320 kHz (250 - 390 kHz)*

Length: 125 ?m (120 - 130 ?m)*

Width: 30 ?m (25 - 35 ?m)*

Thickness: 4 ?m (3.5 - 4.5 ?m)*

* typical rangeThis product features alignment grooves on the back side of the holder chip.

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Standard Tapping Mode AFM Probe

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever: