供应nanoworldBrand,160AC-NAItem#,Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

型号:160AC-NA
价格:请致电：010-67529703
品牌:nanoworld

The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Coating Description

30 nm Al on the back side of the cantilever

Full Technical Data

AFM Tip:

Shape: OPUS

Height: 14 ?m (12 - 16 ?m)*

Radius: < 7 nm

Half Cone Angle: 0° front, 35° back, <9° side

AFM Cantilever:

Shape: Beam

Force Constant: 26 N/m (8 - 57 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 160 ?m (150 - 170 ?m)*

Width: 40 ?m (38 - 42 ?m)*

Thickness: 4 ?m (3.5 - 4.5 ?m)*

* typical range

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Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever: