供应nanoworldBrand,Tap300Al-GItem#,Standard Tapping Mode AFM Probe

Standard Tapping Mode AFM Probe

型号:Tap300Al-G
价格:请致电：010-67529703
品牌:nanoworld

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

Bruker / Veeco / Digital Instruments
Keysight / Agilent / Molecular Imaging
Asylum Research
Park Systems
JEOL
JPK
etc.

For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G!

Consistent high quality at a lower price!

Coating Description

Aluminium reflex coating on detector side of the cantilever, 30 nm thick

Full Technical Data

AFM Tip:

Shape: Rotated

Height: 17 ?m (15 - 19 ?m)*

Setback: 15 ?m (10 - 20 ?m)*

Radius: < 10 nm

Half Cone Angle: 20°-25° front view, 25°-30° from side, 10° at the apex

AFM Cantilever:

Shape: Beam

Force Constant: 40 N/m (20 - 75 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 125 ?m (115 - 135 ?m)*

Width: 30 ?m (25 - 35 ?m)*

Thickness: 4 ?m (3 - 5 ?m)*

* typical range

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Standard Tapping Mode AFM Probe

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever: