供应nanoworldBrand,PPP-NCLRItem#,Tapping Mode AFM Probe, Long Cantilever

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS? PPP-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS? high frequency non contact type (NCH). PPP-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 ?m. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
Al coating on detector side of cantilever
high mechanical Q-factor for high sensitivity
precise alignment of the cantilever position (within +/- 2 ?m) when used with the Alignment Chip
compatible with PointProbe® Plus XY-Alignment Series

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Tapping Mode AFM Probe, Long Cantilever

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever: