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Standard Tapping Mode AFM Probe

型号:PPP-NCH
价格:请致电：010-67529703
品牌:nanoworld

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.

The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS? PPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

This AFM probe offers unique features:

excellent tip radius of curvature
highly doped silicon to dissipate static charge
chemically inert
high mechanical Q-factor for high sensitivity

Coating Description

Uncoated

Full Technical Data

AFM Tip:

Shape: Standard

Height: 10 - 15 ?m

Radius: < 7 nm (< 10 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 42 N/m (10 - 130 N/m)*

Resonance Frequency: 330 kHz (204 - 497 kHz)*

Length: 125 ?m (115 - 135 ?m)*

Width: 30 ?m (22.5 - 37.5 ?m)*

Thickness: 4 ?m (3 - 5 ?m)*