供应nanoworldBrand,ZEIHRItem#,Special Tapping Mode AFM Probe

Special Tapping Mode AFM Probe

型号:ZEIHR
价格:请致电：010-67529703
品牌:nanoworld

NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

Coating Description

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Full Technical Data

AFM Tip:

Shape: Standard

Height: 10 ?m (10 - 15 ?m)*

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 27 N/m (17 - 41 N/m)*

Resonance Frequency: 130 kHz (110 - 150 kHz)*

Length: 225 ?m (220 - 230 ?m)*

Width: 57 ?m (52.5 - 62.5 ?m)*

Thickness: 5 ?m (4.5 - 5.5 ?m)*

* typical range

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Special Tapping Mode AFM Probe

Coating Description

Full Technical Data

AFM Tip:

AFM Cantilever: